ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,106, issued on Nov. 3, was assigned to SEIKO EPSON Corp. (Japan). "Laser interferometer" was invented by Jun Kitagawa (Matsumoto, Japan) and... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,107, issued on Nov. 3, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Semiconductor measurement device" was invented... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,108, issued on Nov. 3, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Semiconductor measurement apparatus" was inven... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,109, issued on Nov. 3, was assigned to Munro Design & Technologies LLC (Ontario, N.Y.). "Reflective co-axial interferometer systems and meth... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,110, issued on Nov. 3, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Semiconductor measuring device using beam disp... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,111, issued on Nov. 3, was assigned to Onto Innovation Inc. (Wilmington, Mass.). "Metrology device with wavelength-frequency multiplexing" w... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,112, issued on Nov. 3, was assigned to NIKON Corp. (Tokyo). "Position-measuring device, position-measuring system, and measuring device" was... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,113, issued on Nov. 3, was assigned to MITUTOYO Corp. (Kanagawa, Japan). "Coordinate measuring machine and in-line measurement system" was i... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,114, issued on Nov. 3, was assigned to LG Energy Solution Ltd. (Seoul, South Korea). "Device and method for measuring sealing gap for second... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,115, issued on Nov. 3, was assigned to OncoRes Medical Pty Ltd (Nedlands, Australia). "Attachment for an elastography and/or imaging device"... और पढ़ें